By Mineralogical Association of Canada

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1997) for their study of meteorites and mantle rocks. 5 kV is used to produce B+ secondary ions. Charge compensation is effectively maintained by a 300–500A gold coating. No energy filtering is used (the energy slit is opened to >120eV), and a resolution of 1800 MRP is applied to separate the interference of 10BH+ on 11B+ (Fig. 2-6). This level of MRP is also sufficient to eliminate any other possible interferences, such as 9 BeH+ on 10B+. Ion counting is by an em detector, using cyclical magnetic peak switching between 10 + B and 11B+.

1997) and subsequent studies, including Decitre et al. (2002), have noted a seemingly unusual feature of the IMF for 7Li+/6Li+ – it is positive (+4% to +6%), meaning that the heavier ion (7Li+), is enriched in the measured ratio. The reproducibility of δ7Li for replicate BHVO analyses was better than ±1‰ (1σ) during single analytical sessions. Decitre et al. (2002) determined Li concentrations separately using energy filtering, counting 7Li+ and 30Si+ at an MRP of 500, with an energy slit of ±10 eV and a sample offset potential of 80 V.

This is sensible, since these instruments still retain virtually 100% transmission at this MRP. , for example, 200 pA of Cs+ rastered over 15µm2 versus the 8 nA in 25 µm spots commonly used in the f-series analyses described above. Pre-sputtering of surface contamination becomes critical at these lower currents, given the drastically reduced rate of material removal. A 200pA primary Cs+ beam will produce the equivalent of >5*107 cps on 16O– (≈105 cps on 18 O) using the above conditions. 5‰ (1σ) per mil for 20 spots, using fully automated analysis of points within 15 mm of the center of a homogeneous sample such as SiO2.

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